VLSI Design and Test: 22nd International Symposium, VDAT...

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VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Name: VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
ISBN: 9789811359507

S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh

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This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

ক্যাটাগোরিগুলো:

Computers - Hardware

সাল:

2019

সংস্করণ:

1st ed.

প্রকাশক:

Springer Singapore

ভাষা:

english

ISBN 10:

9811359504